Technical Specifications:
Acquisition modes: EI full-scan, SIM, timed-SIM (t-SIM); MS/MS modes include MRM/SRM, timed-SRM (t-SRM), combined SRM/FS, product ion scan, precursor ion scan and neutral loss scan.
Mass range: 1.2–1100 u with unit mass resolution.
Fast scanning: up to 20,000 u/s; ability to perform >97 scans/s in full‐scan over ~125 u and up to 800 SRM transitions/s.
Ion sources: ExtractaBrite™ dual-filament EI source (programmable to ~350 °C) and optional Advanced Electron Ionization (AEI) source for ultra-sensitivity.
Mass stability: better than 0.1 u over 48 hours (ΔT ≤ 2 K).
Maintenance/uptime: Incorporates NeverVent™ technology and V-Lock/VPI to allow source/column changes without venting the vacuum.
Key Features:
• Unmatched sensitivity and selectivity: capable of attogram-level detection when configured with AEI source.
• High throughput and transition capacity: up to 800 SRM transitions/s make the system well suited for large compound panels.
• Simplified method setup: SmartTune™, AutoSRM and other software tools streamline developing and transferring methods.
• Robust uptime: maintenance friendly with ExtractaBrite™ source removable under vacuum and NeverVent™ maintenance; reduces downtime.
• Scalable investment: from base configuration to advanced high-sensitivity upgrade path as lab demands increase.
Applications: Used for trace-level quantitation in environmental contaminants (e.g., dioxins, pesticides), food-safety screening, forensic/toxicology substances, pharmaceutical impurity and residual solvent analysis, and other high-throughput targeted MS/MS workflows.